Projects per year
Personal profile
Research profile
Francesco Iannuzzo received the M.Sc. degree in Electronic Engineering and the Ph.D. degree in Electronic and Information Engineering from the University of Naples, Italy, in 1997 and 2002, respectively.
He is currently a professor of reliable power electronics at AAU Energy, Aalborg University, Denmark. His research interests are in the field of reliability of power electronic devices, condition monitoring, failure modeling, and testing to failure, both under power cycling and extreme conditions. He is the author or co-author of more than 300 publications in journals and international conferences, five book chapters, and has edited a book on Modern Power Electronic Devices (2020, IET). He has given more than 30 technical seminars, keynotes, and invited speeches at top-tier conferences such as ISPSD, IRPS, EPE, ECCE, PCIM, and APEC.
Prof. Iannuzzo has been Associate Editor for the IEEE JESTPE and for the OJ-PE. He currently serves as a PELS Adcom member at large and as the chair of the IEEE IAS Power Electronic Devices and Components Committee. He was the General Chair of the ESREF conference in 2018, the IWIPP conference in 2022, and the EPE-ECCE Europe conference in 2023.
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
Education/Academic qualification
Engineering, Ph.D., Study on failure mechanisms of power electronic devices under critical conditions (2nd breakdown), University of Naples Federico II
Award Date: 1 Mar 2002
Keywords
- Electronics
- Reliability in Power Electronics
- Energy
- Sustainable Energy
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Collaborations from the last five years
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New Concepts for Multi-stressor Accelerated Testing of Power Electronic Components
Zhang, K., Blaabjerg, F. & Iannuzzo, F.
01/10/2023 → 30/11/2024
Project: PhD Project
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ISLE: Impact of Short‐circuit Events on Lifetime Expectancy of SiC MOSFETs
Iannuzzo, F., Sangwongwanich, A. & Frøstrup, S.
ECPE Engineering Center for Power Electronics GmbH
15/05/2023 → 31/12/2024
Project: Research
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ALL2GaN: Affordable smart GaN IC solutions as enabler of greener applications
Iannuzzo, F., Bahman, A. S., Novak, M., Sangwongwanich, A., Zhao, S. & Frøstrup, S.
Horizon - Chips Joint Undertaking
01/05/2023 → 30/04/2026
Project: Research
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Modeling and Design of Accelerated Reliability Testing for Power Semiconductors
Yu, X., Zhou, D. & Iannuzzo, F.
01/06/2021 → 31/05/2024
Project: PhD Project
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Stress tests on electronic power modules to assess reliability
01/05/2022 → 31/07/2023
Project: Research
Research output
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Figures-of-Merit Study for Thermal Transient Measurement of SiC MOSFETs
Zhang, Y., Zhang, Y., Wong, V. H., Kalker, S., Caruso, A., Ruppert, L., Iannuzzo, F. & Doncker, R. W. D., 2024, In: IEEE Transactions on Power Electronics . PP, 99, p. 1-13 13 p., 10483537.Research output: Contribution to journal › Journal article › Research › peer-review
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Comparison of Junction Temperature Measurement Using the TSEP Method and Optical Fiber Method in IGBT Power Modules without Silicone Gel Removal
Zhang, K., Leduc, C. & Iannuzzo, F., 2023, PCIM Europe 2023: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. VDE Verlag GMBH, 8 p.Research output: Contribution to book/anthology/report/conference proceeding › Article in proceeding › Research › peer-review
Open AccessFile136 Downloads (Pure) -
Ferrite Beads Design to Improve Turn-off Characteristics of Cascode GaN HEMTs: An Optimum Design Method
Xue, P. & Iannuzzo, F., 1 Jun 2023, In: IEEE Journal of Emerging and Selected Topics in Power Electronics. 11, 3, p. 3184-3194 11 p., 10097721.Research output: Contribution to journal › Journal article › Research › peer-review
File300 Downloads (Pure) -
Investigating the solder mask defects impact on leakage current on PCB under condensing humidity conditions
Zhang, K., Bahman, A. S., Iannuzzo, F., Chopade, A. R., Holst, J., Rao, J. M., Bahrebar, S. & Ambat, R., Nov 2023, In: Microelectronics Reliability. 150, 115210.Research output: Contribution to journal › Journal article › Research › peer-review
Open AccessFile87 Downloads (Pure) -
Lifetime analysis of two commercial PV converters using multi-year degradation modelling
Fogsgaard, M. B., Zhang, Y., Bahman, A. S., Iannuzzo, F. & Blaabjerg, F., Sept 2023, In: e-Prime - Advances in Electrical Engineering, Electronics and Energy. 5, p. 1-9 9 p., 100205.Research output: Contribution to journal › Journal article › Research › peer-review
Open AccessFile1 Citation (Scopus)28 Downloads (Pure)
Prizes
Press/Media
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Debat: Flydende forbindelser gør elektronik mere pålidelig
24/04/2023
1 Media contribution
Press/Media: Press / Media
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Nyt testcenter med fokus på effektelektronik
Francesco Iannuzzo & Frede Blaabjerg
04/09/2020
2 items of Media coverage
Press/Media: Press / Media
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En stjerneforsker fra den kinesiske flåde så potentiale i dansk forskning
Francesco Iannuzzo & Mogens Rysholt Poulsen
27/07/2020
2 items of Media coverage
Press/Media: Press / Media
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Universitet hjalp Kinas flådeekspert
Francesco Iannuzzo & Mogens Rysholt Poulsen
27/07/2020
3 items of Media coverage
Press/Media: Press / Media
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Nye små halvledere bliver hurtigere slidt op af varme og stress
03/07/2020
1 item of Media coverage
Press/Media: Press / Media